- Several measurement ranges from 24 … 26 mm up to 250 mm ... 450 mm
- CMOS receiving element for measurement independent of surface
- High measurement frequency and high linearity
- Variety of selectable integrated calculations based on values from two sensors
- Laser technology for precise measurement or detection of very small objects
- Several output options
- Minimum machine downtimes due to the impressive reliability of the measuring system on any surface
- Highly accurate measurement, even during the production process, ensures high product quality
- High measuring frequency of 10 kHz increases processing speeds and reduces cycle times
- Reference measurement helps negate the need for cost-intensive adjustments to the production process
- Comparatively low investment costs for challenging measuring tasks
- Easy and cost-effective commissioning and servicing due to clear LCD display
- Reduced material costs due to the use of distance sensors to control production processes that have an impact on costs
Measuring range | 24 mm ... 450 mm 1) |
Resolution | 0.1 µm ... 50 µm 2) |
Repeatability |
0.3 µm 2) 3 µm 2) 15 µm 2) 150 µm 2) |
Response time | 0.5 ms 3) |
Measuring frequency | 10 kHz |
Switching output |
5 x PNP (100 mA) 4) 5 x NPN (100 mA) 4) |
Ambient temperature |
Operation –10 °C ... +45 °C Storage –20 °C ... +60 °C |
Data interface | RS-232 |
1) 6 % ... 90 % remission.
2) Measurement on 90 % remission (ceramic, white), for OD25-x measurement on mirror, averaging set to: 256, constant ambient conditions.
3) Automatic sensitivity adjustment ≤ 2 ms.
4) PNP: HIGH = VS - (< 2 V) / LOW = < 2 V, NPN: HIGH = < 2 V / LOW = VS.
Inquiry - OD Max